搜索结果: 1-6 共查到“电子科学与技术 Prediction”相关记录6条 . 查询时间(0.051 秒)
Propagation Prediction Over Random Rough Surface By Zeroth Order Induced Current Density
Zeroth order induced current density Volterra integral equation of the second kind Analytical solution to zeroth order Monte-Carlo simulations Random rough surface mean propagation factor
2014/12/8
Electromagnetic wave propagation over random sea surfaces is a classical problem of interest for the Navy, and significant research has been done over the years. Here we make use of numerical and anal...
A Critical Review on Electromagnetic Precursors and Earthquake Prediction
Critical Review Electromagnetic Precursors Earthquake Prediction
2009/7/28
Seismo-electromagnetic precursory-based earthquake prediction studies are criticized in terms of their scientific content, problem complexity, signal excitation and propagation, causal relations with ...
Statistical Model of Hot-Carrier Degradation and Lifetime Prediction for P-MOS Transistors
Hot-carrier P-MOS transistor lifetime prediction
2009/7/28
Along with advances in microelectronics, and computer and space technologies, device dimensions are becoming smaller; as a result, hot-carrier effect, lifetime prediction, and reliability become more ...
Some Investigations on the Anisotropy of the Chemical Etching of (h k 0) and (h h I) Silicon Plates in a NaOH 35% Solution. Part III: Determination of a Database for the Simulator Tensosim and Prediction of 2D Etching Shapes
Silicon Anisotropic etching NaOH etchant Tensorial and kinematic model Simulator TENSOSIM
2010/12/7
The simulation of 2D etching shapes such as surface profiles and out-of-roundness profiles related to various (h k 0) and (h h l) silicon plates or cross-sections is studied. The theoretical basis of ...
Reliability Prediction of Thick Film Hybrid Integrated Circuits
Reliability Prediction methods Thick film ICs
2010/12/16
When using the well known handbooks for reliability predicting (MIL, CNET) some problems occur in quality assessment of components which are not produced according to the requirements of the US milita...
Model for Reliability Prediction of Thick Film Resistors
Thick Film Resistors the random variable
2010/12/23
A model for time-to-failure prediction based on component parameter drift is described. The idea for creation of this model is based on the influence of time-dependent random and non random factors on...