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The Wisconsin Center for Dairy Research (CDR)
The Wisconsin Center for Dairy Research Dairy Research
2014/6/10
The Wisconsin Center for Dairy Research (CDR) is the premier dairy research center. Located within a licensed, operating dairy plant on the University of Wisconsin-Madison campus, CDR builds on Wiscon...
Over-Sampling based Burst-mode CDR Technology for High-speed TDM-PON Systems
Networks Optical communications
2015/5/22
We review recent progress of a over-sampling based burst-mode CDR as the key PMD device for supporting next-generation, 10Gbps capable TDM-PON systems. For the essence of circuit design, its burst-mod...
1.25/10.3Gbps dual rate algorithm for 10G-EPON burst-mode CDR
Fiber optics communications Optical communications
2015/6/11
We present new dual rate algorithm for a burst-mode CDR and successfully achieved rapid burst-mode data recovery of less than 16ns at 1.25Gbps and of less than 6.4ns at 10.3Gbps in the same platform.
A 82.5-GSample/s (10.3125-GHz x 8 phase-shifted clocks) sampling IC for 10G-EPON burst-mode CDR
phase-shifted clocks IC 10G-EPON burst-mode CDR
2015/7/17
New very high-speed 82.5-GS/s sampling IC and its incorporated burst-mode CDR compliant for 10G-EPON is presented. The 82.5-GS/s sampling CDR successfully achieved a high pulse-width distortion tolera...
10.3Gb/s burst-mode 3R receiver incorporating full AGC optical receiver and 82.5GS/s sampling CDR for 10G-EPON systems
receiver incorporating AGC optical receiver CDR 10G-EPON systems
2015/7/16
10.3Gb/s burst-mode 3R receiver incorporating full AGC optical receiver and 82.5GS/s sampling CDR for 10G-EPON is, for the first time, developed. Burst receiver sensitivity of -30.1dBm and upstream po...
Demonstration of 10.3-Gbit/s Burst-mode CDR employing 0.13 um SiGe BiCMOS Quad-rate sampling IC and Data-phase decision-algorithm for 10Gbps-based PON Systems
Burst-mode CDR SiGe BiCMOS Quad-rate sampling IC Data-phase decision-algorithm PON Systems
2015/8/6
We present a new 10Gbps-based PON burst-mode CDR with a 0.13 um BiCMOS quad-rate sampling IC and decision-algorithm for optimum recovery-data selection.Instantaneous burst-mode recovery of the first b...
温度对CDR-1型差动热分析仪仪器常数的影响
常数 CDR-1型差动热分析仪仪器 温度
2008/5/4
采用6种标准物质测定CDR-1型差动热分析仪的差热分析法和差示扫描量热法
仪器常数，结果表明：CDR-1型差动热分析仪的差热分析法和差示扫描量热法仪器常数均随温
度的升高而增大，而差热分析法仪器常数受温度的影响更为显著。用最小二乘法得出在一定
条件下差热分析法和差示扫描量热法仪器常数与温度的函数关系。对KNO3样品的摩尔晶型转变
焓和摩尔熔化焓进行的对照测定表明：用相应转变温度下的仪器常...