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IRPS is the preeminent conference for timely research on Reliability Physics of devices, materials, circuits, and products used in the electronics industry. IRPS is the venue where important reliabili...
This paper presents the intrinsic geometric model for the solution of power system planning and its operation. This problem is large-scale and nonlinear, in general. Thus, we have developed the intri...
Recent proposals using heterostructures of superconducting and either topologically insulating or semiconducting layers have been put forth as possible platforms for topological quantum computation. T...
Reliability analysis of probabilistic forecasts, in particular through the rank histogram or Talagrand diagram, is revisited. Two shortcomings are pointed out: Firstly, a uniform rank histogram is but...
A solution is developed to improve the irradiation reliability of SOI NMOSFET (N-type Metal Oxide Semiconductor Field Effect Transistor). This solution, including SOI (Silicon On Insulator) wafer har...
There is a constraining relation between the reliability of a quantum measurement and the extent to which the measurement process is, in principle, reversible. The greater the information that is gain...
2006Vol.46No.1pp.113-118DOI: A Reliability Analysis of Calculated Results for Odd-Even and Odd-Odd Nuclei in Relativistic Mean-Field Theory DING Bin-Gang,1 ZHANG Da-Li,1 and LU Di...
Historical development of the starspot hypothesis and the unsolved problems associated with it are presented. The "non{uniqueness" attributed to the spot solutions is a major problem which could still...

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