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Determination of Optical Constant of Materials by two Different Methods: An Application to Single Crystals Si
Optical Constant Si Single Crystals Oscillator Fit Procedure Kramers-Kronig Analysis
2010/4/15
The normal reflectance of single crystal Si was measured at 0.5 5.6 eV range by unpolarized light. Optical parameters of Si were determined from this reflectance data by using two different metho...