搜索结果: 1-3 共查到“光学仪器及技术 SEM”相关记录3条 . 查询时间(0.054 秒)
SEM/FIB stage calibration with photogrammetric methods
Metrology Microscopy Calibration Bundle Adjustment Accuracy
2015/8/25
Precise sample stage positioning plays an important role for various FIB (Focused Ion Beam) and SEM (scanning electron microscope) applications in micro- and nanotechnology. During the last few years,...
选取具不同生长应力水平的人工林尾巨桉(Eucalyptus urophylla × E. grandis)正常木为研究对象，借助场发射环境扫描电子显微镜系统，结合以溴元素做标记的X射线能谱分析技术，分析了尾巨桉细胞壁微区木质素沉积与生长应力的关系。研究结果表明，木纤维细胞壁各微区间木质素含量的大小关系与生长应力高低无关，其含量顺序为细胞角隅>复合胞间层>次生壁(S1>S2>S3);而随着生长应力增...